01.07.-03.07.2019

20. Tagung Festkörperanalytik

Vienna, Austria

Overview

We will present in-situ TEM from DENSsolutions, the AFSEM from GETec which offers researches the possibility to perform correlative AFM and SEM measurements as well as our x-ray laboratory systems from Sigray for µ-XRF, XAS and XRM research. Our manufacturer Deben completes our product range with different in-situ stages for SEM and CT-applications.

Meet our colleagues:

Andreas Bergner
Product Manager - Electron microscopy & nanotechnology
+49 6151 8806-12
Fax: +49 6151 8806912
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